International Research Journal of Commerce , Arts and Science
( Online- ISSN 2319 - 9202 ) New DOI : 10.32804/CASIRJ
**Need Help in Content editing, Data Analysis.
Adv For Editing Content
RAMAN STUDIED ON CUPRIC TELLURIDE THIN FILMS
2 Author(s): MUKESH SHEORAN, DR. ARUNESH KUMAR
Vol - 3, Issue- 3 , Page(s) : 247 - 255 (2012 ) DOI : https://doi.org/10.32804/CASIRJ
Copper telluride thin films have been prepared utilizing an electrodeposition method on various substrates. The ITO electrode in white and Cu solution are used and H2SO4 has been used to help electrolyte for CuTe film development. The thickness value of the film deposited has been determined by stylus profilometry. An study of X-ray diffraction showed a polycrystalline nature in prepared films. The bands of the Raman were well balanced with the frequencies measured. The Raman spectra composed generally of completely symmetrical high-intensity modes superimposed on single-tone signals of decay.